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Abstract: As CMOS technology scales down into the nanometer regime, the NBTI effect becomes a major issue for circuit reliability. This paper proposes an NBTI-aware design method with dual-Vth logic ...
Abstract: To improve the performance of the dual-vector model predictive torque control (MPTC) scheme for SPMSM, for sectors II, IV, and VI, this paper attempts to improve the traditional dual-vector ...
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