SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...
Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...
The Canadian Journal of Statistics / La Revue Canadienne de Statistique, Vol. 35, No. 2 (Jun., 2007), pp. 249-264 (16 pages) The authors propose a goodness-of-fit test for parametric regression models ...
Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...
SAN FRANCISCO — Agilent Technologies Inc., Cascade Microtech Inc., and Tokyo Seimitsu Co. Ltd. here teamed up to announce the development of a new parametric tester that promises to lower the cost of ...
Scandinavian Journal of Statistics, Vol. 28, No. 4 (Dec., 2001), pp. 725-732 (8 pages) We consider the comparison of point processes in a discrete observation situation in which each subject is ...
Nonparametric methods form an important core of statistical techniques and are typically used when data do not meet parametric assumptions. Understanding the foundation of these methods, as well as ...
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