When a warehouse manager suspects poor system performance, the first step is typically to check the real data. Unfortunately, more than 50% of the time, system performance is measured incorrectly.

Process Engineer Richard Kasica of NIST’s Center for Nanoscale Science and Technology holds a wafer of the type typically produced in the plasma-enhanced chemical vapor deposition chamber. A new study ...

Test instruments such as oscilloscopes and DMMs (digital multimeters) often let you get the measurement results you need with just the press of a button. But the number on a meter's display or the ...

A program for calibration and routine testing of weighing instruments ensures accurate results. A measurement of any kind is affected by the errors and uncertainties that exist in that measurement ...

All analog measurements — voltage, current, temperature, humidity, etc. — include some amount of error. Your job is to minimize those errors enough to give your ...

Measurement error models address the deviation between observed and true values, thereby refining the reliability of statistical inference. These frameworks are ...

There are many ways that measurement can be used in the diagnostic process and in assessing the incidence of diagnostic errors, according to the committee that authored the Institute of Medicine’s ...

Patch-clamp recording techniques have revolutionized understanding of the function and sub-cellular location of ion channels in excitable cells. The cell-attached patch-clamp configuration represents ...

Estimating equations which are not necessarily likelihood-based score equations are becoming increasingly popular for estimating regression model parameters. This paper is concerned with estimation ...

Process Engineer Richard Kasica of NIST’s Center for Nanoscale Science and Technology holds a wafer of the type typically produced in the plasma-enhanced chemical vapor deposition chamber. A new study ...