Since the first transistors went into production almost six decades ago, semiconductor manufacturers have looked for ways to reduce test time and manufacturing costs. As the industry has grown from ...

Stutensee, GermanyHans Baka started to work for Digitaltest in Stutensee in 1994 as marketing and sales manager and became managing director in 1997. Before joining Digitaltest, he held ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach.

TEWKSBURY, Mass., March 27, 2008 /PRNewswire/ -- The Missile Defense Agency has awarded a $22.9 million contract modification to Raytheon Company (NYSE: RTN) to develop an initial Concurrent Test, ...

Owing to the prevalence of multicore processors, more and more programs are written in a multi-threaded style to improve performance. However, associated concurrency errors have become an inconvenient ...

Derek Wu, senior staff applications engineer at Advantest, looks at the need for doing multiple tests at the same time as chip designs become more complex, increasingly heterogeneous, and much more ...