AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

Understanding how dislocations (line defects in the crystal structure) occur when 3D-printing metals has been unclear to materials scientists. Understanding when and how dislocations form in ...

Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...

A new way to do full-wafer, in-line monitoring to identify missing vias in the back end of line. A viable in-line monitor for missing vias in the back end of line (BEOL) has traditionally been ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...