Since its ratification in the early 1990s, the IEEE 1149.1 Boundary Scan (JTAG) specification has shown that a well-thought-out standard can be resilient, adaptive, and quite useful in applications ...
Boundary scan emerged in the 1980s as a way to measure continuity along circuit-board traces and into the I/O pins of devices soldered to the PCBs—all without external probing. Initial work by the ...
Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...
CAMBRIDGE, England XJTAG has developed XJRunner, a graphical add-on to its XJTAG boundary scan development system and designed for production sites that need to improve and speed up the testing of ...
Enhancement Reduces Test Development Costs and Improves Time-To-Market SAN JOSE, Calif. -- April 2, 2009-- LogicVision, Inc. (Nasdaq: LGVN), a leading provider of semiconductor built-in-self-test ...
RICHARDSON, Texas (May 14, 2008) – Responding to the increasing momentum in the electronics industry toward embedded instrumentation, ASSET® InterTech, Inc. (www.asset-intertech.com) announced it is ...
Richardson, TX (Nov. 2, 2010) – The ASSET® ScanWorks® platform for embedded instruments has the industry’s first toolkit to automate the development of validation and test routines based on the ...
In medium-volume assembly manufacturing, flying probe testers are becoming increasingly popular for in-circuit inspection.
CERRITOS, Calif.--(BUSINESS WIRE)--Corelis, a leader in JTAG Boundary-Scan technology and embedded hardware test solutions, is thrilled to announce its participation in two premier industry events.