Board-level and semiconductor test data are often analyzed separately, limiting correlation across the product lifecycle. Linking PCB assembly (PCBA) test results, including in-circuit and functional ...

Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.

Expertise from Forbes Councils members, operated under license. Opinions expressed are those of the author. So, what does this mean for the organizations that develop these products? It means that ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

A High-End Storage Manufacturing and Validation Platform for the AI Era. Driven by surging demand from AI applications, ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...