Electronic Design

Dynamic Probe Targets FPGA Debug

The B4655A FPGA dynamic probe application works with the company’s logic analyzers to debug Xilinx FPGAs, including the Virtex-II, Virtex-II Pro, and Spartan-3 families. Interacting with on-chip ...
AZoNano

Dynamic Testing Technique to Perform Nanoscale Mechanical Property Measurements

Hysitron nanoDMA III from Bruker is the latest powerful dynamic testing method to perform nanoscale mechanical property measurements. nanoDMA III is fitted with the recently developed CMX control ...
Semiconductor Engineering

Driving Toward Predictive Analytics With Dynamic Parametric Test

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Semiconductor Engineering

Test Connections Clean Up With Real-Time Maintenance

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...