Gen Precision Launches Automated DIMM Final Test System GTK-SPT1 for Unattended DRAM Module Testing

SPT1, an automated DIMM final test system designed to increase testing throughput as AI and server demand put growing ...
Semiconductor Engineering

Smaller Geometries, Bigger Demands: The Role Of OCD In GAA Logic And Vertical Gate DRAM Process Control

AI workloads are pushing the boundaries of compute, memory, and interconnect architectures, and to meet these goals, manufacturers are rapidly accelerating advanced logic and DRAM development. Chief ...