Business Wire

Research and Markets: Defects-Recognition, Imaging and Physics in Semiconductors XIV

DUBLIN--(BUSINESS WIRE)--Research and Markets (http://www.researchandmarkets.com/research/vl39ww/defectsrecognitio) has announced the addition of the "Defects ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

AI Models Transform Defect Inspection And Review, But Can Fail To Scale

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.