IEEE

Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro

Abstract: This article presents a comprehensive assessment of the impact of various design assist techniques on the inherent performance and reliability of native resistive RAM (RRAM) on silicon. The ...
Hackaday

The Staggering Complexity And Subtlety Of Concurrency

If you’re gonna be a hacker eventually you’re gonna have to write code. And if you write code eventually you’re gonna have to ...
MIT Technology Review

LLMs contain a LOT of parameters. But what’s a parameter?

Think back to middle school algebra, like 2 a + b. Those letters are parameters: Assign them values and you get a result. In ...
IEEE

Two New Algorithms for Maximum Likelihood Estimation of Sparse Covariance Matrices With Applications to Graphical Modeling

Abstract: In this paper, we propose two new algorithms for maximum-likelihood estimation (MLE) of high dimensional sparse covariance matrices. Unlike most of the state-of-the-art methods, which either ...