Abstract: We investigate the reliability of state-of-the-art SiGe heterojunction bipolar transistors (HBTs) in 55-nm technology under mixed-mode stress. We perform electrical characterization and ...
Abstract: Multivariate time series anomaly detection is of great interest because of its wide range of applications. Since it is difficult to obtain accurate anomaly labels, many unsupervised anomaly ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback