The sheen of satin, the subtle glints of twill, the translucence of sheer silk: Fabric has long been difficult to render ...
Abstract: The integration of physics-based modelling and artificial intelligence (AI) is transforming semiconductor device simulation, facilitating unparalleled precision, efficiency, and predictive ...
Abstract: The artificial neural network (ANN)-based compact modeling methodology is evaluated in the context of advanced field-effect transistor (FET) modeling for Design-Technology-Cooptimization ...
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