Enlightened, multidisciplinary engineers may be dismantling the oft-decried wall between design and test, but some of the bricks that made up that wall may have been reassembled into a wall between ...

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...