Abstract: This paper outlines the establishment of a generic cryogenic CMOS database in which key electrical parameters and transfer characteristics of the MOSFETs are quantified as functions of ...
Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...
Designed and simulated all fundamental and universal CMOS logic gates (NOT, AND, OR, NAND, NOR, XOR, XNOR) using the Electric VLSI Design Tool. This project includes schematic design, DRC-clean ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback