Abstract: With evolving landscape of direct current (DC) power transmission and distribution, a reliable and fast protection against faults is critical. High performance DC solid-state circuit ...
Abstract: This study aimed to evaluate the reliability of Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) under extremely high gate voltage stress. The research ...
It used to be a rite of passage to be able to do the math necessary to design various bipolar transistor amplifier ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback