Abstract: In this paper, we propose a process-aware analytical gate resistance model for nanosheet field-effect transistors (NSFETs). The proposed NSFET gate resistance is modeled by applying the ...
Abstract: Innovation and digitalization are crucial for Small and Medium sized Enterprises (SMEs) to maintain a competitive edge with Artificial Intelligence (AI) and digital tools playing a key role ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback