IEEE

Semi-Supervised Graph Constraint Dual Classifier Network With Unknown Class Feature Learning for Hyperspectral Image Open-Set Classification

Abstract: In view of the practical value of open datasets of hyperspectral images (HSIs), HSI open-set classification (OSC) has attracted more and more attention. Existing HSI OSC methods are usually ...
IEEE

A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)

Abstract: The semiconductor industry plays a vital role in modern technology, with semiconductor devices embedded in almost all electronic products. As these devices become increasingly complex, ...