This feature allows you to generate images using diffusers models like Tongyi-MAI/Z-Image-Turbo directly within the web UI. Note: Image generation does not work with ...
STARKVILLE, Miss.—Mississippi State’s Institute for Imaging and Analytical Technologies soon will be home to a scanning electron microscope so advanced that it will be the first of its kind in the ...
Scanning electron microscopy (SEM) images are already a common staple of battery research. Now, they can be paired with a simple algorithm to enable better prediction of lithium metal battery ...
This study presents a comprehensive investigation into the intricate microstructural characteristics of tight reservoir rocks, utilizing advanced micro-CT scanning and FIB-SEM technologies. Micro-CT ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
Abstract: Scanning electron microscopy (SEM) plays an important role in providing high-resolution imaging in various fields, including industrial chip manufacturing, materials science, and nanoscale ...
A recent study published in the Journal of Geophysical Research: Machine Learning and Computation presents a new image enhancement process for scanning electron microscopy (SEM) data sets, called Deep ...
A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...
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