KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Abstract: To overcome the drawbacks of manual defect detection and the challenges of traditional visual inspection algorithms, such as high missed detection rates, slow detection speeds, and ...
Abstract: Steel surface defect detection is critical for ensuring product quality, yet remains challenging due to multi-scale defects, small target prevalence, and complex background interference. To ...
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