China’s microelectromechanical systems (MEMS) sensor industry is surging, but technical gaps, fragmented production and coordination challenges hinder its full potential. As global demand accelerates, ...
Abstract: In this study, we evaluate parasitic capacitance between the node contact (NC) and the bit-line (BL) in advanced dynamic random-access memory (DRAM) devices. Process modeling was used to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback