Scanning electron microscopy is a general type of electron microscopy that generates a topological image of a sample using a beam of electrons to achieve much higher spatial resolution than light ...

Scanning probe microscopy images a sample by scanning a physical probe just above the surface. A variety of different probes and detection modalities can be used to generate either a topological map ...

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However Samsung kept whittling it down even stripping the slot from the A5,3 series of devices leaving the slot on the A16.