IEEE

A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer

Abstract: In semiconductor manufacturing processes, monitoring the quality of wafers is one of the most important steps to quickly detect process faults and significantly reduce yield loss. Fail bit ...
IEEE

Synthesis of Liveness-Enforcing Petri Net Supervisors Based on a Think-Globally-Act-Locally Approach and Vector Covering for Flexible Manufacturing Systems

Abstract: This paper proposes the synthesis of Petri net supervisors based on a think-globally-actlocally (TGAL) approach and a vector covering technique for flexible manufacturing systems. Given a ...
GitHub

.NET Training and Tutorials

Within each content area, there are one or more tutorials. Each tutorial consists of lessons. Each lesson should be a page detailing the concept being taught, along with sample code. Lesson and page ...
GitHub

practical-tutorials

Customer stories Events & webinars Ebooks & reports Business insights GitHub Skills ...