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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Chronic obstructive pulmonary disease (COPD) is a leading cause of morbidity and mortality globally. Effective management ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
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