A Husqvarna researcher developed a fast, interpretable PV hotspot-detection method using IR thermography and Lab* color-space features instead of heavy neural networks, achieving up to 95.2% accuracy ...
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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
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