LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Santa Rosa, CA. Keysight Technologies has introduced two extreme-temperature probing solutions: the N7007A extreme-temperature 400-MHz passive probe and the N7013A extreme-temperature extension kit ...
In an extreme heat environment, such as during the sintering of powdered metals, in solid waste incinerators, or in oil or gas fired-furnaces, thermocouple probes need to be able to withstand extreme ...
STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...
It’s remarkable how tiny electronics have become. Heaven knows what an old-timer whose experience started with tubes must think, to go from solder tags to SMD in a lifetime is some journey. Even the ...
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